Tapping into the Technology of the Future

At Battelle, we’re leading the effort to protect critical systems from suspicious or malicious integrated circuits–from our analysis capabilities to our deep multidisciplinary research that shapes the next generation of technologies.

A Trusted Partner in Microelectronics Assurance & Verification

Battelle applies vertically integrated, multidisciplinary research methodologies to close the gap between the increasing complexity of electronic components and the ability to verify and assure the system functionality.
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    Physical Verification
    • Destructive analysis 
    • Design verification
    • High-resolution optical and electron (SEM) imaging
    • Advanced semiconductor failure analysis technique development, including applied scanning optical microscopy (SOM)
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    Functional Verification
    • Nondestructive detection of counterfeit microelectronics using second order effects
    • Novel active and passive nondestructive technique development
    • Applied mathematics for complexity-tolerance trust and assurance