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IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)

  • Dates:
    Dec 15
     - 
    Dec 16, 2020
  • How to find us: http://paine-conference.org/sponsorship/
The IEEE PAINE Virtual Conference covers the broad topic of hardware security and trust.

Battelle is proud to sponsor and participate in PAINE 2020.  

Battelle staff will be presenting:

DAY 2 (December 16, 2020)

SESSION V : IC Assurance from 10:20-10:40 am
Dr. Adam Kimura, Battelle

From Silicon to Simulation: A Full End-to-End Decomposition of a Fabricated 130 nm Serial Peripheral Interface for Establishing a Hardware Assurance Baseline Root-of-Trust

SESSION VII: Advanced Imaging and Sample Preparation from 2:10-2:30 pm
Jon Scholl – Battelle
Sample Mounting Methods for Precision Delayering of 130 nm Integrated Circuit Devices

Join us to learn more about our microelectronics trust and assurance capabilities. Faulty or maliciously-altered microelectronics can cause mission-critical systems to fail. Battelle offers a scalable, science-based approach to this complex security problem.