The IEEE PAINE Virtual Conference
covers the broad topic of hardware security and trust.
Battelle is proud to sponsor and participate in PAINE 2020.
Battelle staff will be presenting:
DAY 2 (December 16, 2020)
SESSION V : IC Assurance from 10:20-10:40 am
Dr. Adam Kimura, Battelle
From Silicon to Simulation: A Full End-to-End Decomposition of a Fabricated 130 nm Serial Peripheral Interface for Establishing a Hardware Assurance Baseline Root-of-Trust
SESSION VII: Advanced Imaging and Sample Preparation from 2:10-2:30 pm
Jon Scholl – Battelle
Sample Mounting Methods for Precision Delayering of 130 nm Integrated Circuit Devices
Join us to learn more about our microelectronics trust and assurance capabilities. Faulty or maliciously-altered microelectronics can cause mission-critical systems to fail. Battelle offers a scalable, science-based approach to this complex security problem.