Webinar
Measuring What Matters: Innovative Approaches
Measuring What Matters: Innovative Approaches
to PFAS Analysis in Semiconductor Wastewater
Learn how Battelle’s semiconductor-specific advanced analytical methods can be used to better understand PFAS in waste streams, develop PFAS monitoring programs, and conduct treatment technology evaluations.
Register For the Webinar
About the Webinar
Date: September 30, 2026
Time: 1:00 p.m. EST
Location: Virtual
With PFAS emerging as a critical environmental and regulatory challenge to the semiconductor industry, companies need answers about how to understand and manage PFAS sources.
Join Battelle experts Paige Jacob, Ph.D. and Shalene Thomas, R.E.P. for an informative no-cost webinar that explores PFAS analytical techniques for complex semiconductor matrices and how they can be used to confidently test, monitor and evaluate PFAS treatment in semiconductor manufacturing.
Key Topics and Themes
Understanding PFAS in Semi Waste Streams
Developing PFAS Monitoring Programs
Conducting Treatment Technology Evaluations
Q&A: PFAS Analysis in Semiconductors
Featured Experts
-
Shalene Thomas, R.E.P
Sr. Emerging Contaminants Program ManagerShalene provides thought leadership, drives R&D and service offerings for Battelle’s growing PFAS and other potential emerging contaminant programs. She has more than 25 years of experience in environmental consulting that includes 15 years of experience providing PFAS strategic management services to government and commercial clients. -
Paige Jacob, Ph.D.
PFAS Chemistry Program ManagerPaige delivers client-facing leadership for research execution and consultation services, advancing Battelle’s mission to deliver innovative solutions for PFAS challenges across critical industries, including semiconductors. She brings a combination of technical expertise, strategic insight, and industry relationships that helps clients understand PFAS sources, interpret complex analytical data, and implement economically viable treatment solutions.